Scanning Electron Microscopy (SEM)
Zeiss Sigma VP (NL1.160F)
![Zeiss Sigma](/research/core-facilities/emcf/assets/zeiss-sigmaVP-450x300.jpg)
Zeiss Sigma VP
Specifications:
- Field Emission SEM
- ET Detector
- In-Lens Detector
- Back Scatter Detector
- High-vacuum operation for highest resolution
- Low-vacuum operation allows imaging of uncoated samples
- Sign Up for Sigma VP